像我之前的其他人一样，我的 xfs 驱动器上的 superblock 已损坏。我试过 xfs_repair 和 xfs_repair -L 来恢复驱动器，但都报告了相同的结果：
Phase 1 - find and verify superblock...
superblock read failed, offset 0, size 524288, ag 0, rval -1
fatal error -- Input/output error
{mkfs.xfs -Nf /dev/sdb1} 报告以下内容：
meta-data=/dev/sdb1 isize=512 agcount=4, agsize=244188544 blks
= sectsz=4096 attr=2, projid32bit=1
= crc=1 finobt=1, sparse=1, rmapbt=0
= reflink=1
data = bsize=4096 blocks=976754176, imaxpct=5
= sunit=0 swidth=0 blks
naming =version 2 bsize=4096 ascii-ci=0, ftype=1
log =internal log bsize=4096 blocks=476930, version=2
= sectsz=4096 sunit=1 blks, lazy-count=1
realtime =none extsz=4096 blocks=0, rtextents=0
在关注了关于这个主题的各种帖子后，这些帖子都与我上面尝试过的内容相似，我有一种下沉的感觉，驱动器内容丢失了（感谢 EDF Energy）。有没有人有任何进一步的恢复建议？
编辑：SMART扫描结果...
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD40EFRX-68N32N0 1
Serial Number: PBGJYR4S
LU WWN Device Id: 5 000cca 23dc7b57b
Firmware Version: MJAOA5F0
User Capacity: 4,000,787,030,016 bytes [4.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Jun 11 19:11:40 2021 BST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 248) Self-test routine in progress...
80% of test remaining.
Total time to complete Offline
data collection: ( 24) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 136 136 054 Pre-fail Offline - 80
3 Spin_Up_Time 0x0007 176 176 024 Pre-fail Always - 411 (Average 468)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 14
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 121 121 020 Pre-fail Offline - 34
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 6222
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 14
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 273
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 273
194 Temperature_Celsius 0x0002 142 142 000 Old_age Always - 42 (Min/Max 20/42)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 174 174 000 Old_age Always - 1272
SMART Error Log Version: 1
ATA Error Count: 1272 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1272 occurred at disk power-on lifetime: 6220 hours (259 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 21 5f b7 c0 01 Error: ICRC, ABRT 33 sectors at LBA = 0x01c0b75f = 29407071
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 00 b7 c0 e0 08 1d+02:04:04.303 READ DMA EXT
25 00 f8 00 b6 c0 e0 08 1d+02:04:04.303 READ DMA EXT
25 00 08 f8 b5 c0 e0 08 1d+02:04:04.302 READ DMA EXT
25 00 08 f0 b5 c0 e0 08 1d+02:04:04.302 READ DMA EXT
25 00 08 e8 b5 c0 e0 08 1d+02:04:04.302 READ DMA EXT
Error 1271 occurred at disk power-on lifetime: 6220 hours (259 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 97 b5 c0 01 Error: ICRC, ABRT 1 sectors at LBA = 0x01c0b597 = 29406615
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 90 b5 c0 e0 08 1d+02:04:04.096 READ DMA EXT
25 00 08 88 b5 c0 e0 08 1d+02:04:04.095 READ DMA EXT
25 00 08 80 b5 c0 e0 08 1d+02:04:04.095 READ DMA EXT
25 00 08 78 b5 c0 e0 08 1d+02:04:04.095 READ DMA EXT
25 00 08 70 b5 c0 e0 08 1d+02:04:04.095 READ DMA EXT
Error 1270 occurred at disk power-on lifetime: 6220 hours (259 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 81 7f b5 c0 01 Error: ICRC, ABRT 129 sectors at LBA = 0x01c0b57f = 29406591
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 b4 c0 e0 08 1d+02:04:03.858 READ DMA EXT
25 00 f8 08 0a 00 e0 08 1d+02:04:03.856 READ DMA EXT
c8 00 08 f8 08 00 e0 08 1d+02:04:03.856 READ DMA
c8 00 08 f0 08 00 e0 08 1d+02:04:03.856 READ DMA
c8 00 08 e8 08 00 e0 08 1d+02:04:03.855 READ DMA
Error 1269 occurred at disk power-on lifetime: 6220 hours (259 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 c7 08 00 00 Error: ICRC, ABRT 1 sectors at LBA = 0x000008c7 = 2247
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 c0 08 00 e0 08 1d+02:04:03.648 READ DMA
c8 00 08 b8 08 00 e0 08 1d+02:04:03.641 READ DMA
27 00 00 00 00 00 e0 08 1d+02:04:03.640 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 a0 08 1d+02:04:03.638 IDENTIFY DEVICE
ef 03 42 00 00 00 a0 08 1d+02:04:03.636 SET FEATURES [Set transfer mode]
Error 1268 occurred at disk power-on lifetime: 6220 hours (259 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 bf 08 00 00 Error: ICRC, ABRT 1 sectors at LBA = 0x000008bf = 2239
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 b8 08 00 e0 08 1d+02:04:03.440 READ DMA
c8 00 08 b0 08 00 e0 08 1d+02:04:03.440 READ DMA
c8 00 08 a8 08 00 e0 08 1d+02:04:03.440 READ DMA
c8 00 08 a0 08 00 e0 08 1d+02:04:03.440 READ DMA
c8 00 08 98 08 00 e0 08 1d+02:04:03.440 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xb0) Completed without error 00% 36443 -
# 2 Vendor (0x71) Completed without error 00% 36443 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.