Eu tinha um novo SSD Sandisk de 1 TB (SDSSDA-1T00-G27) que estava funcionando muito bem, exceto pelo atributo SMART #9, "Power_On_Hours", que estava avançando muito lentamente. A maioria das pessoas não se importaria, mas isso me incomodou, então entrei em contato com o suporte da SanDisk. Eles me fizeram executar o diagnóstico deles, que só funciona no Windows, então movi a unidade para meu computador Windows. Tudo passou, e esse utilitário também alegou o mesmo tempo de inicialização ridiculamente baixo; algo como 7 horas, quando deveria ter sido 2 semanas.
Eles me enviaram um novo e surpresa, a mesma coisa. Eu o tenho no meu servidor Linux há mais de 24 horas e ele ainda alega 0 horas. Eu não o particionei ou montei ainda, então ele não viu nenhuma atividade, no entanto , hdparm -Iretorna Advanced power management level: 254e hdparm -Cretorna, drive state is: active/idleentão ele não está dormindo.
Provavelmente não há como mudar esse comportamento, mas eu queria saber se mais alguém já passou por isso e se eles sabem o que está acontecendo. Todo HDD e SSD que eu tive nos últimos 15 anos se comporta normalmente desse ponto de vista, incluindo outro Sandisk de 9-10 anos atrás.
Suspeito que ele esteja contando apenas o uso ativo, o que é estranho se for verdade.
Aqui está a saída inteira de smartctl -x. Lembrete: esta unidade foi ligada em um sistema por cerca de 48 horas no momento desta edição, mas também não foi particionada ou montada ainda. Eu queria ver como ela se comporta sem leituras/gravações.
smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.1.0-28-amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Marvell based SanDisk SSDs
Device Model: SanDisk SSD PLUS 1000GB
Serial Number: <deleted>
LU WWN Device Id: 5 001b44 8c62efa27
Firmware Version: 42077100
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-4, ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Mar 11 08:02:07 2025 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x71) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
Conveyance self-test routine
recommended polling time: ( 1) minutes.
SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct -O--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 3
165 Total_Write/Erase_Count -O--CK 100 100 000 - 0
166 Min_W/E_Cycle -O--CK 100 100 000 - 0
167 Min_Bad_Block/Die -O--CK 100 100 000 - 19
168 Maximum_Erase_Cycle -O--CK 100 100 000 - 0
169 Total_Bad_Block -O--CK 100 100 000 - 176
170 Unknown_Marvell_Attr -O--CK 100 100 000 - 0
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 0
173 Avg_Write/Erase_Count -O--CK 100 100 005 - 0
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 0
184 End-to-End_Error -O--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 100 100 014 - 24 (Min/Max 21/28)
199 SATA_CRC_Error -O--CK 100 100 000 - 0
230 Perc_Write/Erase_Count -O--CK 100 100 000 - 0 0 0
232 Perc_Avail_Resrvd_Space PO--CK 100 100 004 - 100
233 Total_NAND_Writes_GiB -O--CK 100 100 000 - 0
234 Perc_Write/Erase_Ct_BC -O--CK 100 100 000 - 0
241 Total_Writes_GiB ----CK 253 253 000 - 0
242 Total_Reads_GiB ----CK 253 253 000 - 0
244 Thermal_Throttle -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 16 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0-0xa1 GPL,SL VS 1 Device vendor specific log
0xa2 GPL,SL VS 2 Device vendor specific log
0xa3-0xa7 GPL,SL VS 1 Device vendor specific log
0xde GPL,SL VS 1 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (empty) ==
0x05 ===== = = === == Temperature Statistics (empty) ==
0x07 ===== = = === == Solid State Device Statistics (empty) ==
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC