我最近在阅读 Computer Architecture-A Quantitative Approach(6th edition)，在尝试理解第 34 页中的一节时遇到了一个问题：
Given the tremendous price pressures on commodity products such as DRAM and SRAM, designers
have included redundancy as a way to raise yield. For a number of years, DRAMs have regularly
included some redundant memory cells so that a certain number of flaws can be accommodated.
良率实际上不是指通过测试过程制造的 DRAM 数量（在许多批量生产的 DRAM 中）吗？如果是这样，向单个 DRAM 添加冗余存储单元如何增加 DRAM 的良率机会。此外，该行所指的“一定数量的缺陷”的一些示例是什么。